National Repository of Grey Literature 1 records found  Search took 0.00 seconds. 
Methodology of not destructive determination of phosphorus concentration profile in Si wafers
Holovský, Jakub ; Remeš, Zdeněk
A new method of determination of diffusion profiles in fast, not destructive and contactless (with help of infra-red reflexion) way was designed, theoretically analysed, realized either in computational and in experimental field and finally successfully tested.

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